MIL-STD-1285D
APPENDIX K
K.3.1.7 Inspection lot date code. Semiconductor devices shall be marked by a code indicating the date the lot was submitted for inspection. The first two numbers in the code shall be the last two digits of the number of the year. The third and fourth numbers shall be two digits indicating the calendar week of the year (see 5.2.5b). When the number of the week is a single digit, it shall be preceded by a zero. Reading from left to right or from top to bottom, the code number shall designate the year and the week, in that order. When more than one lot of a type is inspected for conformance within the same week, an inspection lot suffix letter shall be chosen, consisting of a single capital letter, and shall appear on each semiconductor device immediately following the submission date. This letter shall be chosen by the manufacturer so that each inspection lot is uniquely identified by the submission date and by the lot-identification suffix letter, if one is required.
K.3.1.8 Manufacturer's designating symbol. The designating symbol shall be used only by the manufacturer to whom it has been assigned and only on those devices manufactured at that manufacturer's plant. In the case of small devices, the manufacturer's designating symbol may be abbreviated by omitting the first "C" in the series of letters.
K.3.1.9 Manufacturer's identification. Semiconductor devices shall be marked with the name or trademark of the manufacturer who has contracted to manufacture devices for the Government or its equipment manufacturers, and at whose plant the specified conformance inspection has been performed. The identification of the equipment manufacturer may appear on the device only if the equipment manufacturer is also the device manufacturer. The name or trademark of only the original manufacturer shall appear on the device or initial container. Rebranding shall not be permitted.
K.3.1.10 Country of origin. The phrase "Made in U.S.A." shall be marked in small characters below or adjacent to other marking specified in paragraph 1 except that, for semiconductor devices made in a foreign country, the phrase shall be changed accordingly.
K.3.1.11 Marking option. The manufacturer has the option of marking the entire lot or only the sample devices to be subjected to conformance inspection. If the manufacturer exercises the option to mark only the sample
devices, the procedure shall be as follows:
a. The sample devices shall be marked prior to performance of conformance inspection.
b. At the completion of inspection, the marking of the sample devices shall be inspected for conformance to the requirements of this standard.
c. The inspection lot represented by a conforming inspection sample shall then be marked and any specified visual and mechanical inspection performed.
d. The marking materials and processing applied to the inspection lot shall be the same specifications as those used for the inspection sample.
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