electromagnetic interference. Filters furnished to the requirements of this specification contain shunting ceramic discoidal capacitors and series inductors \(FSC 5915\). Capacitors furnished to the requirements of this specification contain shunting ceramic discoidal capacitors \(FSC 5910\). For the purposes of this specification, feed-through capacitor types \(C circuit configuration\) are referred to herein as a filter. Passband power may be alternating current \(ac\) or direct current \(dc\) and the filters used primarily in the reduction of broadband radio frequency interference. This specification provides for two levels of product assurance requirements. Filters covered by this specification are capable of operation over the temperature range of -55 degrees C to +125 degrees C.

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MIL-PRF-28861D

APPENDIX B

GUIDELINES FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA) OF CLASS S FILTERS

B.1 SCOPE

B.1.1 Scope. This appendix provides a means of characterizing the internal structural features of filters using

ceramic capacitors. The method to be used for cross sectioning and inspection are described. Applications of these

methods will ensure uniform preparation and analysis. This appendix is a mandatory part of the specification. The

information contained herein is intended for compliance only.

B.2. APPLICABLE DOCUMENTS

B.2.1 General. The documents listed in this section are specified in sections B3 or B4 of this appendix. This

section does not include documents cited in other sections of this appendix or recommended for additional

information or as examples. While every effort has been made to ensure the completeness of this list, document

users are cautioned that they must meet all specified requirements of documents cited in sections B3 or B4 of this

appendix, whether or not they are listed.

B.2.2 Non-Government publications. The following documents form a part of this appendix to the extent specified

herein. Unless otherwise specified, the issues of the documents that are DOD adopted are those listed in the issue

of the DODISS cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DODISS

are the issues of the documents cited in the solicitation (see 6.2).

ELECTRONIC INDUSTRIES ALLIANCE (EIA)

EIA-469 - Standard Test Method for Destructive Physical Analysis of High Reliability Ceramic

Monolithic Capacitors. (DoD adopted)

(Copies of this document are available at https://global.ihs.com or Global Engineering Documents, Attn: Customer

Service Department, 15 Inverness Way East, Englewood, CO 80112-5776.)

B.2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between

the text of this document and the references cited herein (except for related specification sheets) the text of this

document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

a specific exemption has been obtained.

B.3. PROCEDURE

B.3.1 Sample selection. A sample or samples shall be randomly selected from those units that have not failed

any previous tests.

B.3.2 X-ray review. Prior to sample preparation, review x-ray negatives for internal component location and

anomalies that can be highlighted during cross sectioning.

B.3.3 Sample preparation.

B.3.3.1 Cleaning prior to mounting. Each DPA sample shall be cleaned prior to mounting. Each filter shall be

swabbed with a cotton swab saturated with isopropyl alcohol. The filters shall then be allowed to air dry for 3 minutes

prior to mounting.

B.3.3.2 Mounting. The filters shall be mounted such that they will be ground from the outside diameter toward the

inside diameter resulting in a cross-sectioned plane parallel to the longitudinal axis.